Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films

Digital Discovery, 2023, 2,1334-1346
DOI: 10.1039/D2DD00149G, Paper
Open Access Open Access
Siyu Isaac Parker Tian, Zekun Ren, Selvaraj Venkataraj, Yuanhang Cheng, Daniil Bash, Felipe Oviedo, J. Senthilnath, Vijila Chellappan, Yee-Fun Lim, Armin G. Aberle, Benjamin P. MacLeod, Fraser G. L. Parlane, Curtis P. Berlinguette, Qianxiao Li, Tonio Buonassisi, Zhe Liu
thicknessML predicts film thickness from reflection and transmission spectra. Transfer learning enables thickness prediction of different materials with good performance. Transfer learning also bridges the gap between simulation and experiment.
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